Highest Reliability OTP Non-Volatile Memory

Novocell Smartbit

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  • No need for ECC 

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You are hereNovocell Announces Completion of Mil-Spec and Automotive IP Qualifications and Radiation Tolerance

Novocell Announces Completion of Mil-Spec and Automotive IP Qualifications and Radiation Tolerance

Smartbit-based OTP NVM Survives Exposure to Extremes of High Temperature and Radiation While Maintaining Data

August 10, 2012 -  Hermitage, PA   Novocell Semiconductor, Inc., the leading innovator in embedded, high reliability one-time programmable (OTP) antifuse non-volatile memory (NVM), has responded to the demands of their growing number of military, aerospace, and automotive industry customers, announcing today that their Smartbit™-based antifuse OTP memory designs have completed the rigorous exposure to long term high temperature exposure required for Military and Automotive applications, as well as survived extended exposure to radioactive Cobalt-60 necessary to establishing Rad-Hard (radiation hardened) status.

Within the past year, Novocell Semiconductor has extended the routine high temperature operating life (HTOL) temperature range to provide ...

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Novocell Smartbit™ OTP Memory IP significantly reduces costs by implementing highly reliable antifuse technology in standard logic CMOS, without additional process steps.

The entire Smartbit-based OTP family avoids the data retention issues associated with floating gate memory. Unlike polysilicon or laser fuses, it is possible to route over Novobits, NovoBytes and NovoHD, thus consuming no additional chip area.

With the Novocell Smartbit design, our anti-fuse oxide breakdown high voltage is contained entirely within the bit cell itself, and supports programming at wafer, in package, or in circuit.

Learn more by downloading our detailed product information briefs and specifications PDF or contact us for a tailored presentation today!